Focused Ion Beam Scanning Electron Microscope (FIB-SEM) - 聚焦离子束扫描电子显微镜

Focused Ion Beam Scanning Electron Microscope (FIB-SEM) – 聚焦离子束扫描电子显微镜

$300.00

Price per sample. Contact us for shipping arrangements and bulk discounts.

SKU: SSA04 Category: Structural & Surface Analysis

Description

Price per sample. Contact us for shipping arrangements and bulk discounts.

Additional information

color	Gray

Reviews

There are no reviews yet.

Be the first to review “Focused Ion Beam Scanning Electron Microscope (FIB-SEM) – 聚焦离子束扫描电子显微镜”