Focused Ion Beam Scanning Electron Microscope (FIB-SEM) - 聚焦离子束扫描电子显微镜

Focused Ion Beam Scanning Electron Microscope (FIB-SEM) – 聚焦离子束扫描电子显微镜

$300.00

Price per sample. Contact us for shipping arrangements and bulk discounts.

SKU： SSA04 分类： Structural & Surface Analysis

描述

Price per sample. Contact us for shipping arrangements and bulk discounts.

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